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A GaN-SiC MMIC Doherty Power Amplifier For K-band Wireless Communications
Furxhi, S.; Marzi, S. D.; Raffo, A.; Giofre, R.; Colantonio, P.
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Institute of Electrical and Electronics Engineers Inc.,
2022 24th International Microwave and Radar Conference, MIKON 2022
pp: 1-3, Anno: 2022 |
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mm-Wave GaN HEMT Technology: Advances, Experiments, and Analysis
Vadala, V.; Crupi, G.; Giofre, R.; Bosi, G.; Raffo, A.; Vannini, G.
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IEEE Computer Society,
Mediterranean Microwave Symposium
Vol. 2022-, No. 1, pp: 420-425, Anno: 2022 |
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How Large-Signal Measurement Techniques Improve the Accuracy of Microwave Transistor Nonlinear Models
Raffo, A.
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Institute of Electrical and Electronics Engineers Inc.,
Asia-Pacific Microwave Conference Proceedings, APMC
Vol. 2022-, No. 1, pp: 178-180, Anno: 2022 |
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Exploitability of Butt-Coupling between Single Mode/Multi Mode VCSEL and G.652 SSMF for future Green Radio-over-Fiber Infrastructures
Nanni, J.; Saderi, G.; Bellanca, G.; Bosi, G.; Raffo, A.; Vadala, V.; Debernardi, P.; Polleux, J. -L.; Tartarini, G.
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Institute of Electrical and Electronics Engineers Inc.,
2022 Italian Conference on Optics and Photonics, ICOP 2022
pp: 1-4, Anno: 2022 |
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200-W GaN PA Design Based on Accurate Multicell Transistor Modeling
Vadala, V.; Raffo, A.; Bosi, G.; Barsegyan, A.; Custer, J.; Formicone, G.; Walker, J.; Vannini, G.
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Institute of Electrical and Electronics Engineers Inc.,
IEEE MTT-S International Microwave Symposium Digest
Vol. 2022, No. 1, pp: 378-381, Anno: 2022 |
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150-nm GaN HEMT Degradation under Realistic Load-Line Operation
Raffo, A.; Vadala, V.; Bosi, G.; Giofre, R.; Vannini, G.
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Institute of Electrical and Electronics Engineers Inc.,
2022 17th European Microwave Integrated Circuits Conference, EuMIC 2022
pp: 141-144, Anno: 2022 |
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Evaluation of Microwave Transistor Degradation Using Low-Frequency Time-Domain Measurements
Bosi, G.; Vadala', V.; Giofre, R.; Raffo, A.; Vannini, G.
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Institute of Electrical and Electronics Engineers Inc.,
2021 34th General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2021
pp: 01-03, Anno: 2021 |
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Advanced Measurement Techniques for Nonlinear Modelling of GaN HEMTs: From L-band to mm-Wave Applications
Vadalà, Valeria; Raffo, A.; Bosi, Gianni; Giofrè, Rocco; Vannini, Giorgio
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Institute of Electrical and Electronics Engineers Inc.,
2021 15th International Conference on Advanced Technologies, Systems and Services in Telecommunications, TELSIKS 2021 - Proceedings
pp: 63-69, Anno: 2021 |
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Empowering GaN-Si HEMT Nonlinear Modelling for Doherty Power Amplifier Design
Bosi, G.; Raffo, A.; Giofre, R.; Vadala, Valeria; Vannini, G.; Limiti, E.
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Institute of Electrical and Electronics Engineers Inc.,
EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference
pp: 249-252, Anno: 2021 |
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Advanced Modelling Techniques Enabling E-Band Power Amplifier Design for 5G Backhauling
Vadala, V.; Raffo, A.; Colzani, A.; Fumagalli, M. A.; Sivverini, G.; Bosi, G.; Vannini, G.
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Institute of Electrical and Electronics Engineers Inc.,
EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference
pp: 161-164, Anno: 2021 |
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Load-Pull Measurements Oriented to Harmonically-Tuned Power Amplifier Design
Bosi, Gianni; Raffo, Antonio; Vadalà, Valeria; Vannini, Giorgio; Avolio, Gustavo; Marchetti, Mauro; Giofre', Rocco; Colantonio, Paolo; Limiti, Ernesto
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Institute of Electrical and Electronics Engineers Inc.,
2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMiC) - Proceedings
pp: 9160151-1-9160151-3, Anno: 2020 |
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GaN FET Load-Pull Data in Circuit Simulators: a Comparative Study
Avolio, G.; Raffo, A.; Marchetti, M.; Bosi, G.; Vadalà, V.; Vannini, G.
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Institute of Electrical and Electronics Engineers Inc.,
2019 14th European Microwave Integrated Circuits Conference (EuMIC)
pp: 80-83, Anno: 2019 |
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A Comprehensive and Critical Overview of the Kink Effect in S22 for HEMT Technology
Crupi, G.; Raffo, A.; Marinkovic, Z.; Schreurs, D. M. M. -P.; Caddemi, A.
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Institute of Electrical and Electronics Engineers Inc.,
2019 14th International Conference on Advanced Technologies, Systems and Services in Telecommunications, TELSIKS 2019 - Proceedings
pp: 13-20, Anno: 2019 |
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Temperature Dependent Small-Signal Neural Modeling of High-Periphery GaN HEMTs
Marinkovic, Z.; Crupi, G.; Vadala, V.; Raffo, A.; Caddemi, A.; Markovic, V.; Schreurs, D. M. M. -P.
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Institute of Electrical and Electronics Engineers Inc.,
2019 14th International Conference on Advanced Technologies, Systems and Services in Telecommunications, TELSIKS 2019 - Proceedings
pp: 33-36, Anno: 2019 |
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GaN HEMT Model with Enhanced Accuracy under Back-off Operation
Vadala', Valeria; Raffo, Antonio; Kikuchi, Ken; Yamamoto, Hiroshi; Bosi, Gianni; Inoue, Kazutaka; Ui, Norihiko; Vannini, Giorgio
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Institute of Electrical and Electronics Engineers Inc.,
2019 14th European Microwave Integrated Circuits Conference (EuMIC)
pp: 37-40, Anno: 2019 |
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Comparison of GaN HEMT Technology Processes by Large-Signal Low-Frequency Measurements
Kikuchi, Ken; Yamamoto, Hiroshi; Ui, Norihiko; Inoue, Kazutaka; Vadala', Valeria; Bosi, Gianni; Raffo, Antonio; Vannini, Giorgio
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Institute of Electrical and Electronics Engineers Inc.,
International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMIC 2018 - Proceedings
pp: 8430002-1-8430002-3, Anno: 2018 |
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An Ultra-Wideband Setup to Monitor Antenna-Impedance Variations in Low-Cost IoT Transmitters
Petrocchi, Alessandra; Raffo, A.; Bosi, G.; Vannini, G.; Yavuz Kapusuz, K.; Lemey, S.; Rogier, H.; Avolio, G.; Schreurs, D.
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Institute of Electrical and Electronics Engineers Inc.,
International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMIC 2018 - Proceedings
pp: 1-3, Anno: 2018 |
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Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers
Yamamoto, Hiroshi; Kikuchi, Ken; Ui, Norihiko; Inoue, Kazutaka; Vadala, Valeria; Bosi, Gianni; Raffo, Antonio; Vannini, Giorgio
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Institute of Electrical and Electronics Engineers Inc.,
2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2018
pp: 44-47, Anno: 2018 |
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Impact of transistor model uncertainty on microwave load-pull simulations
Bosi, Gianni; Raffo, Antonio; Vannini, Giorgio; Avolio, Gustavo; Schreurs, Dominique
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Institute of Electrical and Electronics Engineers Inc.,
I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
pp: 1-6, Anno: 2017 |
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An ultra-wideband sensing board for IoT
Petrocchi, A.; Raffo, A.; Avolio, G.; Lukasik, K.; Resca, D.; Vannini, G.; Lemey, S.; Caytan, O.; Agneessens, S.; Rogier, H.; Schreurs, D.
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Institute of Electrical and Electronics Engineers (IEEE), and Faculty of Electronic Engineering (FEE), University of Niš, Serbia,
Advanced Technologies, Systems and Services in Telecommunications (TELSIKS), 2017 13th International Conference on
pp: 174-177, Anno: 2017 |
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